AELAB Spectral Thickness Gauge AE-XU-100
XU-100 spectral thickness gauge adopts down-illuminated C-cavity design, with micro-focusing X-ray generator and highly integrated vertical optical path system, as well as high-sensitivity zoom ranging device, which can measure all kinds of large and small special-shaped parts quickly, accurately and non-destructively.
AE-XU-100
Quantity:
AE-XU-100 SpectralThicknessGauge
Features
XU-100 spectral thickness gauge adopts down-illuminated C-cavity design, with micro-focusing X-ray generator and highly integrated vertical optical path system, as well as high-sensitivity zoom ranging device, which can measure all kinds of large and small special-shaped parts quickly, accurately and non-destructively.
Detecting various metal glass layers, the detection limit can reach 0.005um, the latest ranging spot diffusion is 10%, and the groove depth measurement range can reach 0-30mm, which is a cost-effective and applicability model for measuring the thickness of the plating layer.

working conditions
Working temperature: 15°C -30°C Power supply: AC 220V± 5V
Relative humidity: < 70%, non-junction power : 95W (without computer)

EFP Software:
  1. Clear operation interface layout
The simple layout design allows the operator to quickly master the basic operation of the software.
  1. Program shortcut button design
Added daily plating program shortcut design button, no need to enter the library to select, you can quickly detect, improve work efficiency.
  1. HD visualization window
The state of the tested sample can be clearly and intuitively observed, and the user's ideal observation effect can be achieved through the zoom adjustment knob.
  1. Multi-channel digital spectrogram interface
Clearly display the elemental spectrum of the sample to be tested, and with advanced solution technology, the results can be accurately calculated.
  1. Real-time monitoring data summary of instrument data
All the data of the instrument can be observed at a glance, and any abnormal system will be reminded at the first time, greatly reducing operating errors.

Technical parameters

Model

Project
AE-XU-100
Collimation holeΦ0.5mmΦ0.2mmΦ0.1mm
Measure the element rangeCl(17)-U(92)
Coating analysis rangeCl(17)-U(92)Li(3)-U(92)
EFP algorithmStandard
Analysis softwareSimultaneous analysis of 5 platings and 10 elementsSimultaneous analysis of 23 plating layers, 24 elements
The ability to detect the same element in different layersNoStandard
Software OperationHumanized closed software, automatically judge fault prompt correction and operation steps, to avoid misoperation
X-ray deviceMicrofocus ray tubeMicrofocus enhanced ray tube
Low light focusing technologyDiffusion of the nearest ranging spot 10%
Measure distanceWith distance compensation function, the measurement distance can be changed to measure concave and convex shaped samples, and the zoom distance can reach 0-30mm
Sample observation1/2.7"color CCD, zoom function
Focus methodHighly sensitive lens, manual focus
MagnificationOptical 38-46X, digital magnification 40-200x
Instrument dimensions550mm×360mm×410mm
Sample chamber dimensions435mm×330mm×140mm
The sample stage movesNo mobile platform (optional)High precision XY manual slide
Movable range--50mm*50mm
Weight45KG48KG
#gauge thickness
#15 gauge thickness
#action thickness gauge
#thickness gauge