AELAB Spectral Thickness Gauge AE-XU-100
XU-100 spectral thickness gauge adopts down-illuminated C-cavity design, with micro-focusing X-ray generator and highly integrated vertical optical path system, as well as high-sensitivity zoom ranging device, which can measure all kinds of large and small special-shaped parts quickly, accurately and non-destructively.
AE-XU-100
Quantity:
AE-XU-100 SpectralThicknessGauge
Features
XU-100 spectral thickness gauge adopts down-illuminated C-cavity design, with micro-focusing X-ray generator and highly integrated vertical optical path system, as well as high-sensitivity zoom ranging device, which can measure all kinds of large and small special-shaped parts quickly, accurately and non-destructively.
Detecting various metal glass layers, the detection limit can reach 0.005um, the latest ranging spot diffusion is 10%, and the groove depth measurement range can reach 0-30mm, which is a cost-effective and applicability model for measuring the thickness of the plating layer.
working conditions
Working temperature: 15°C -30°C Power supply: AC 220V± 5V
Relative humidity: < 70%, non-junction power : 95W (without computer)
EFP Software:
Technical parameters
#gauge thickness
#15 gauge thickness
#action thickness gauge
#thickness gauge
Features
XU-100 spectral thickness gauge adopts down-illuminated C-cavity design, with micro-focusing X-ray generator and highly integrated vertical optical path system, as well as high-sensitivity zoom ranging device, which can measure all kinds of large and small special-shaped parts quickly, accurately and non-destructively.
Detecting various metal glass layers, the detection limit can reach 0.005um, the latest ranging spot diffusion is 10%, and the groove depth measurement range can reach 0-30mm, which is a cost-effective and applicability model for measuring the thickness of the plating layer.
working conditions
Working temperature: 15°C -30°C Power supply: AC 220V± 5V
Relative humidity: < 70%, non-junction power : 95W (without computer)
EFP Software:
- Clear operation interface layout
- Program shortcut button design
- HD visualization window
- Multi-channel digital spectrogram interface
- Real-time monitoring data summary of instrument data
Technical parameters
Model Project | AE-XU-100 | ||
| Collimation hole | Φ0.5mm | Φ0.2mm | Φ0.1mm |
| Measure the element range | Cl(17)-U(92) | ||
| Coating analysis range | Cl(17)-U(92) | Li(3)-U(92) | |
| EFP algorithm | Standard | ||
| Analysis software | Simultaneous analysis of 5 platings and 10 elements | Simultaneous analysis of 23 plating layers, 24 elements | |
| The ability to detect the same element in different layers | No | Standard | |
| Software Operation | Humanized closed software, automatically judge fault prompt correction and operation steps, to avoid misoperation | ||
| X-ray device | Microfocus ray tube | Microfocus enhanced ray tube | |
| Low light focusing technology | Diffusion of the nearest ranging spot 10% | ||
| Measure distance | With distance compensation function, the measurement distance can be changed to measure concave and convex shaped samples, and the zoom distance can reach 0-30mm | ||
| Sample observation | 1/2.7"color CCD, zoom function | ||
| Focus method | Highly sensitive lens, manual focus | ||
| Magnification | Optical 38-46X, digital magnification 40-200x | ||
| Instrument dimensions | 550mm×360mm×410mm | ||
| Sample chamber dimensions | 435mm×330mm×140mm | ||
| The sample stage moves | No mobile platform (optional) | High precision XY manual slide | |
| Movable range | -- | 50mm*50mm | |
| Weight | 45KG | 48KG | |
#15 gauge thickness
#action thickness gauge
#thickness gauge